Analysis
GD-MS (Glow Discharge Mass Spectrometry)
Precise microstructure and composition analysis
GDMS resolves trace elements and impurities in a material’s microstructure and composition down to very low concentrations (ppm to ppb). Trace element composition is measured precisely at ppm to ppb levels.
Sample analysis data
Semi-quantitative analysis
GDMS analysis quantifies the metallic and non-metallic impurities in a material and traces contamination that can enter during processing, securing compositional uniformity and high purity. That improves the electrical properties, reliability, and process reproducibility of the material, and lets us supply high-quality materials that meet customer requirements consistently.
EBSD (Electron Backscatter Diffraction)
Precise grain structure and crystal orientation analysis
EBSD evaluates grain size and crystal orientation precisely and characterizes microstructure and deformation behavior systematically. This lets us interpret microstructural change against process conditions quantitatively, supporting material uniformity, reliability, and quality.
Analysis data
Grain size analysis
Crystal orientation analysis (IPF map)
